Nova Ltd. Ordinary Shares
NVMI Real Time Price USDRecent trades of NVMI by members of U.S. Congress
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Recently reported changes in NVMI holdings by institutional investors
Quarterly net insider trading by NVMI's directors and management
* Insider trading data parsed from SEC Form 4 filings by Quiver Quantitative. Sign up for the Quiver API for real-time access.
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About
Key Metrics
Return (1d)
Return (30d)
Return (1Y)
CAGR (Total)
Max Drawdown
Beta
Alpha
Sharpe Ratio
Win Rate
Average Win
Average Loss
Annual Volatility
Annual Std Dev
Information Ratio
Treynor Ratio
Total Trades
Metrics Definitions
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Alpha
Measures a portfolio's risk-adjusted performance against that of its benchmark
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Annual Standard Deviation
Measures how much the portfolio's total return varies from its mean or average.
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Annual Volatility
A statistical measure of the dispersion of returns for the portfolio.
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Average Win
The average return (%) for trades that resulted in a positive return.
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Average Loss
The average return (%) for trades that resulted in a negative return.
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Beta
A measure of the volatility of the portfolio compared to the market as a whole.
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CAGR
CAGR (Compounded Annual Growth Rate), is the historical annualized rate of return for an investment strategy, throughout the backtest period.
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Information Ratio
A measurement of portfolio returns beyond the returns of its benchmark compared to the volatility of those returns.
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Max Drawdown
the maximum observed loss from a peak to a trough of a portfolio, before a new peak is attained.
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Sharpe Ratio
The Sharpe Ratio is a measure of historical risk-adjusted return, which quantifies the amount of return that an investor received per unit of risk.
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Total Trades
The total number of trades made by this strategy.
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Treynor Ratio
Attempts to measure how successful an investment is in providing compensation to investors for taking on investment risk.
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Win Rate
The percentage of total trades that resulted in a positive return.
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Government lobbying spending instances
NVMI Estimated quarterly lobbying spending
NVMI Revenue by Segment or Geography
New NVMI patent grants
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Patent Title: Optical phase measurement method and system Nov. 11, 2025
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Patent Title: Raman spectroscopy based measurement system Nov. 11, 2025
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Patent Title: Combined ocd and photoreflectance method and system Aug. 19, 2025
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Patent Title: Accurate raman spectroscopy Jul. 29, 2025
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Patent Title: Optical metrology system and method Jul. 15, 2025
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Patent Title: Systems and methods for optical metrology Jul. 15, 2025
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Patent Title: Machine and deep learning methods for spectra-based metrology and process control Jun. 03, 2025
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Patent Title: Optical technique for material characterization May. 13, 2025
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Patent Title: Metrology and process control for semiconductor manufacturing Feb. 25, 2025
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Patent Title: X-ray based measurements in patterned structure Jan. 14, 2025
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Patent Title: Measuring local cd uniformity using scatterometry and machine learning Dec. 10, 2024
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Patent Title: Accurate raman spectroscopy Dec. 10, 2024
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Patent Title: Accurate raman spectroscopy Nov. 26, 2024
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Patent Title: Monitoring system and method for verifying measurements in patterned structures Nov. 26, 2024
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Patent Title: Raman spectroscopy based measurements in patterned structures Aug. 20, 2024
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Patent Title: Semiconductor device manufacture with in-line hotspot detection Aug. 06, 2024
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Patent Title: Detecting outliers and anomalies for ocd metrology machine learning Jul. 16, 2024
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Patent Title: Integrated measurement system May. 28, 2024
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Patent Title: Optical phase measurement system and method Apr. 02, 2024
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Patent Title: Layer detection for high aspect ratio etch control Mar. 12, 2024
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Patent Title: Optical technique for material characterization Mar. 12, 2024
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Patent Title: Method and system for non-destructive metrology of thin layers Feb. 20, 2024
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Patent Title: Raman spectroscopy based measurement system Feb. 20, 2024
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Patent Title: Scatterometry system and method Feb. 13, 2024
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Patent Title: Method and system for optical characterization of patterned samples Jan. 30, 2024
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Patent Title: System and method for controlling measurements of sample's parameters Jan. 16, 2024
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Patent Title: Optical metrology system and method Jan. 09, 2024
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Patent Title: Accurate raman spectroscopy Jan. 02, 2024
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Patent Title: Machine and deep learning methods for spectra-based metrology and process control Nov. 14, 2023
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Patent Title: Method and system for broadband photoreflectance spectroscopy Oct. 31, 2023
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Patent Title: Metrology and process control for semiconductor manufacturing Sep. 19, 2023
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Patent Title: Self-supervised representation learning for interpretation of ocd data Sep. 05, 2023
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Patent Title: Accurate raman spectroscopy Aug. 29, 2023
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Patent Title: X-ray based measurements in patterned structure Jul. 04, 2023
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Patent Title: Test structure design for metrology measurements in patterned samples May. 02, 2023
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Patent Title: Optical technique for material characterization Jan. 03, 2023
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Patent Title: Optical system and method for measuring parameters of patterned structures in micro-electronic devices Nov. 29, 2022
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Patent Title: Dock seal system Nov. 01, 2022
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Patent Title: Optical phase measurement system and method Oct. 04, 2022
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Patent Title: Metrology method and system Sep. 20, 2022
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Patent Title: Accurate raman spectroscopy Aug. 16, 2022
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Patent Title: Time-domain optical metrology and inspection of semiconductor devices Jun. 21, 2022
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Patent Title: Apparatus and method for electrical test prediction May. 17, 2022
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Patent Title: Tem-based metrology method and system Apr. 19, 2022
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Patent Title: Process control of semiconductor fabrication based on spectra quality metrics Apr. 12, 2022
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Patent Title: Raman spectroscopy based measurement system Apr. 05, 2022
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Patent Title: Raman spectroscopy based measurements in patterned structures Mar. 15, 2022
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Patent Title: Hybrid metrology method and system Oct. 19, 2021
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Patent Title: Layer detection for high aspect ratio etch control Aug. 31, 2021
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Patent Title: Patient monitoring apparatus Aug. 13, 2013
Federal grants, loans, and purchases
Estimated quarterly amount awarded to NVMI from public contracts
Recent insights relating to NVMI
Recent picks made for NVMI stock on CNBC
ETFs with the largest estimated holdings in NVMI
- ... Highest Price Target
- ... Median Price Target
- ... Lowest Price Target
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- Is $NVMI stock a Buy, Sell, or Hold?
- What is the price target for $NVMI stock?
* Analyst consensus is not financial advice. Please see our data disclaimers .
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- Who owns $NVMI stock?
- Who owns the most shares of $NVMI stock?
- What funds own $NVMI stock?
* These are estimates based on data taken from SEC filings. There may be inaccuracies due to parsing errors, accidental double-counting, incorrect classification of indirectly owned shares, or any other number of issues.
The Quiver Smart Score combines our data on Congress Trading, Lobbying, Insider Trading, CNBC Mentions and more to provide a comprehensive view of the strength of a stock's underlying data.
The Smart Score grades stocks on a scale of 1 (weakest) to 10 (strongest) based on the strength of the underlying data.Sign Up to view NVMI Smart Score
See concise summaries of analyst reports, presenting both bullish and bearish arguments for a stock.
Example:
The Bulls Say summary highlights positive aspects of the stock.
The Bears Say summary points out potential risks and negative aspects of the stock.
Nova Ltd is a semiconductor equipment manufacturer. The company provides metrology solutions for process control used in semiconductor manufacturing. The company offers in-line optical and x-ray stand-alone metrology systems, as well as integrated optical metrology systems. The product range consists of Nova 2040, Nova 3090Next, Nova i500 and i500 Plus, Nova T500, Nova T600, Nova V2600, HelioSense 100, Nova Hybrid Metrology solution, NovaMars. The company generates the majority of its revenue from China. Geographically the company has its business spread across the region of Taiwan, Korea, China, the United States, and Europe.