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PDF Solutions Inc

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PDFS Stock Insider Trading Activity Follow @QuiverQuant for major insider updates
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PDFS Stock Institutional Owners
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PDFS Derivatives Institutional Owners
Investor
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Recently reported changes in PDFS holdings by institutional investors

Quarterly net insider trading by PDFS's directors and management

* Insider trading data parsed from SEC Form 4 filings by Quiver Quantitative. Sign up for the Quiver API for real-time access.

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Backtest Start Date
CAGR (Total)
Return (30d)
Return (1Y)
  • 1M
  • 3M
  • 6M
  • YTD
  • 1Y
  • 2Y
  • 5Y
  • MAX

About

Backtest Start Date

Key Metrics

Return (1d)

Return (30d)

Return (1Y)

CAGR (Total)

Max Drawdown

Beta

Alpha

Sharpe Ratio

Win Rate

Average Win

Average Loss

Annual Volatility

Annual Std Dev

Information Ratio

Treynor Ratio

Total Trades

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Metrics Definitions
  • Alpha

    Measures a portfolio's risk-adjusted performance against that of its benchmark

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  • Annual Standard Deviation

    Measures how much the portfolio's total return varies from its mean or average.

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  • Annual Volatility

    A statistical measure of the dispersion of returns for the portfolio.

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  • Average Win

    The average return (%) for trades that resulted in a positive return.

  • Average Loss

    The average return (%) for trades that resulted in a negative return.

  • Beta

    A measure of the volatility of the portfolio compared to the market as a whole.

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  • CAGR

    CAGR (Compounded Annual Growth Rate), is the historical annualized rate of return for an investment strategy, throughout the backtest period.

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  • Information Ratio

    A measurement of portfolio returns beyond the returns of its benchmark compared to the volatility of those returns.

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  • Max Drawdown

    the maximum observed loss from a peak to a trough of a portfolio, before a new peak is attained.

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  • Sharpe Ratio

    The Sharpe Ratio is a measure of historical risk-adjusted return, which quantifies the amount of return that an investor received per unit of risk.

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  • Total Trades

    The total number of trades made by this strategy.

  • Treynor Ratio

    Attempts to measure how successful an investment is in providing compensation to investors for taking on investment risk.

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  • Win Rate

    The percentage of total trades that resulted in a positive return.

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Government lobbying spending instances

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Corporate Lobbying Dashboard

PDFS Estimated quarterly lobbying spending

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Corporate Lobbying Dashboard

PDFS Revenue by Segment or Geography

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Revenue Breakdown Dashboard
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Revenue Breakdown Dashboard
PDFS Income Statement
PDFS Balance Sheet
PDFS Cash Flow
U.S. Patents

New PDFS patent grants

  • Patent Title: Advanced node standard logic cells that utilizes ts cut mask(s) and avoid dfm problems caused by closely spaced gate contacts and tscut jogs May. 29, 2018
  • Patent Title: Integrated circuit containing does of gatecnt-tip-to-side-short-configured, ncem-enabled fill cells May. 29, 2018
  • Patent Title: Process for making semiconductor dies, chips, and wafers using non-contact measurements obtained from does of ncem-enabled fill cells on test wafers that include multiple means/steps for enabling nc detection of gatecnt-gate via opens Apr. 24, 2018
  • Patent Title: Method for accurate measurement of leaky capacitors using charge based capacitance measurements Apr. 24, 2018
  • Patent Title: Integrated circuit including ncem-enabled, side-to-side gap-configured fill cells, with ncem pads formed from at least three conductive stripes positioned between adjacent gates Apr. 17, 2018
  • Patent Title: Process for making and using a semiconductor wafer containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including tip-to-side short configured fill cells, and the second doe including chamfer short configured fill cells Mar. 27, 2018
  • Patent Title: Process for making an integrated circuit that includes ncem-enabled, tip-to-side gap-configured fill cells, with ncem pads formed from at least three conductive stripes positioned between adjacent gates Mar. 27, 2018
  • Patent Title: Process for making and using a semiconductor wafer containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including side-to-side short configured fill cells, and the second doe including chamfer short configured fill cells Mar. 20, 2018
  • Patent Title: Integrated circuit including ncem-enabled, snake-configured fill cells, with ncem pads formed from at least three conductive stripes positioned between adjacent gates Mar. 20, 2018
  • Patent Title: Integrated circuit including ncem-enabled, via-open/resistance-configured fill cells, with ncem pads formed from at least three conductive stripes positioned between adjacent gate Mar. 06, 2018
  • Patent Title: Integrated circuit including ncem-enabled, diagonal gap-configured fill cells, with ncem pads formed from at least three conductive stripes positioned between adjacent gates Mar. 06, 2018
  • Patent Title: Integrated circuit including ncem-enabled, corner gap-configured fill cells, with ncem pads formed from at least three conductive stripes positioned between adjacent gates Mar. 06, 2018
  • Patent Title: Process for making and using mesh-style ncem pads Mar. 06, 2018
  • Patent Title: Integrated circuit containing standard logic cells and library-compatible, ncem-enabled fill cells, including at least via-open-configured, aacnt-short-configured, gatecnt-short-configured, and metal-short-configured, ncem-enabled fill cells Feb. 27, 2018
  • Patent Title: Process for making semiconductor dies, chips, and wafers using non-contact measurements obtained from does of ncem-enabled fill cells on test wafers that include multiple means/steps for enabling nc detection of v0 via opens Feb. 27, 2018
  • Patent Title: Process for making an integrated circuit that includes ncem-enabled, interlayer overlap-configured fill cells, with ncem pads formed from at least three conductive stripes positioned between adjacent gates Feb. 20, 2018
  • Patent Title: Integrated circuit including ncem-enabled, tip-to-tip gap-configured fill cells, with ncem pads formed from at least three conductive stripes positioned between adjacent gates Jan. 30, 2018
  • Patent Title: Process for making and using a semiconductor wafer containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including tip-to-tip short configured fill cells, and the second doe including chamfer short configured fill cells Jan. 16, 2018
  • Patent Title: Process for making semiconductor dies, chips and wafers using non-contact measurements obtained from does of ncem-enabled fill cells on test wafers that include multiple means/steps for enabling nc detection of aacnt-ts via opens Jan. 16, 2018
  • Patent Title: Integrated circuit including ncem-enabled, interlayer overlap-configured fill cells, with ncem pads formed from at least three conductive stripes positioned between adjacent gates Jan. 16, 2018
  • Patent Title: Snap-to valid pattern system and method Jan. 16, 2018
  • Patent Title: Process for making and using a semiconductor wafer containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including snake open configured fill cells, and the second doe including stitch open configured fill cells Jan. 09, 2018
  • Patent Title: Method for manufacturing a semiconductor product wafer Dec. 19, 2017
  • Patent Title: Integrated circuit containing does of gate-snake-open-configured, ncem-enabled fill cells Nov. 28, 2017
  • Patent Title: Integrated circuit containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including tip-to-tip short configured fill cells, and the second doe including chamfer short configured fill cells Nov. 21, 2017
  • Patent Title: Integrated circuit containing first and second does of standard cell compatible, ncem-enabled fill cells with first doe including tip-to-side short configured fill cells and second doe including chamfer short configured fill cells Nov. 14, 2017
  • Patent Title: Integrated circuit containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including via open configured fill cells, and the second doe including metal island open configured fill cells Nov. 14, 2017
  • Patent Title: Mesh-style ncem pads, and process for making semiconductor dies, chips, and wafers using in-line measurements from such pads Oct. 31, 2017
  • Patent Title: Integrated circuit containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including chamfer short configured fill cells, and the second doe including corner short configured fill cells Oct. 24, 2017
  • Patent Title: Integrated circuit containing does of ncem-enabled fill cells Oct. 24, 2017
  • Patent Title: Integrated circuit containing standard logic cells and library-compatible, ncem-enabled fill cells, including at least via-open-configured, aacnt-short-configured, gate-short-configured, and ts-short-configured ncem-enabled fill cells Oct. 17, 2017
  • Patent Title: E-beam inspection apparatus and method of using the same on various integrated circuit chips Oct. 17, 2017
  • Patent Title: Process for making and using a semiconductor wafer containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including snake open configured fill cells, and the second doe including metal island open configured fill cells Oct. 10, 2017
  • Patent Title: Process for making and using a semiconductor wafer containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including via open configured fill cells, and the second doe including stitch open configured fill cells Oct. 10, 2017
  • Patent Title: Integrated circuit containing standard logic cells and library-compatible, ncem-enabled fill cells, including at least chamfer-short-configured, aacnt-short-configured, gatecnt-short-configured, and ts-short-configured, ncem-enabled fill cells Oct. 10, 2017
  • Patent Title: Process for making semiconductor dies, chips, and wafers using non-contact measurements obtained from does of ncem-enabled fill cells on wafers that include multiple steps for enabling nc detecteion of aacnt-ts via opens Oct. 10, 2017
  • Patent Title: Integrated circuit containing standard logic cells and library-compatible, ncem-enabled fill cells, including at least via-open-configured, ts-short-configured, metal-short configured, and aa-short-configured, ncem-enabled fill cells Oct. 03, 2017
  • Patent Title: Integrated circuit containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including snake open configured fill cells, and the second doe including metal island open configured fill cells Oct. 03, 2017
  • Patent Title: Integrated circuit containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including merged-via open configured fill cells, and the second doe including snake open configured fill cells Sep. 26, 2017
  • Patent Title: Process for making and using a semiconductor wafer containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including chamfer short configured fill cells, and the second doe including corner short configured fill cells Sep. 26, 2017
  • Patent Title: Integrated circuit containing standard logic cells and library-compatible, ncem-enabled fill cells, including at least chamfer-short-configured, aacnt-short-configured, gate-short-configured, and gatecnt-short-configured, ncem-enabled fill cells Sep. 26, 2017
  • Patent Title: Integrated circuit containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including side-to-side short configured fill cells, and the second doe including chamfer short configured fill cells Sep. 19, 2017
  • Patent Title: Process for making and using a semiconductor wafer containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including merged-via open configured fill cells, and the second doe including snake open configured fill cells Sep. 19, 2017
  • Patent Title: Integrated circuit containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including merged-via open configured fill cells, and the second doe including metal island open configured fill cells Sep. 19, 2017
  • Patent Title: Integrated circuit containing standard logic cells and library-compatible, ncem-enabled fill cells, including at least chamfer-short-configured, aacnt-short-configured, gate-short-configured, and ts-short-configured, ncem-enabled fill cells Sep. 12, 2017
  • Patent Title: Integrated circuit containing standard logic cells and library-compatible, ncem-enabled fill cells, including at least via-open-configured, gatecnt-short-configured, metal-short-configured, and aa-short-configured, ncem-enabled fill cells Sep. 12, 2017
  • Patent Title: Integrated circuit containing standard logic cells and library-compatible, ncem-enabled fill cells, including at least via-open-configured, aacnt-short-configured, gate-short-configured, and ts-short-configured, ncem-enabled fill cells Sep. 12, 2017
  • Patent Title: Integrated circuit containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including via open configured fill cells, and the second doe including merged-via configured fill cells Sep. 12, 2017
  • Patent Title: Process for making and using a semiconductor wafer containing first and second does of standard cell compatible, ncem-enabled fill cells, with the first doe including side-to-side short configured fill cells, and the second doe including tip-to-side short configure Aug. 29, 2017
  • Patent Title: Integrated circuit containing standard logic cells and library-compatible, ncem-enabled fill cells, including at least via-open-configured, aacnt-short-configured, gate-short-configured, and gatecnt-short-configured, ncem-enables fill cells Aug. 22, 2017
Government Contracts

Federal grants, loans, and purchases

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Government Contracts

Estimated quarterly amount awarded to PDFS from public contracts

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PDFS News

Recent insights relating to PDFS

CNBC Recommendations

Recent picks made for PDFS stock on CNBC

Top ETF Holders

ETFs with the largest estimated holdings in PDFS

PDFS Analyst Ratings

PDFS Stock Forecasts
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PDFS Analyst Forecasts
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Current
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Frequently Asked Questions
  • Is $PDFS stock a Buy, Sell, or Hold?

  • What is the price target for $PDFS stock?

* Analyst consensus is not financial advice. Please see our data disclaimers .

PDFS Top Shareholders
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PDFS Options Owners
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Underlying Shares
Frequently Asked Questions
  • Who owns $PDFS stock?

  • Who owns the most shares of $PDFS stock?

  • What funds own $PDFS stock?

* These are estimates based on data taken from SEC filings. There may be inaccuracies due to parsing errors, accidental double-counting, incorrect classification of indirectly owned shares, or any other number of issues.

PDFS Stock Smart Score

The Quiver Smart Score combines our data on Congress Trading, Lobbying, Insider Trading, CNBC Mentions and more to provide a comprehensive view of the strength of a stock's underlying data.

The Smart Score grades stocks on a scale of 1 (weakest) to 10 (strongest) based on the strength of the underlying data.
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Bull Case vs Bear Case

See concise summaries of analyst reports, presenting both bullish and bearish arguments for a stock.

Example:

Bulls Say:

The Bulls Say summary highlights positive aspects of the stock.

Bears Say:

The Bears Say summary points out potential risks and negative aspects of the stock.

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About PDFS

PDF Solutions Inc offers products and services designed to empower engineers and data scientists across the semiconductor ecosystem to improve the yield, quality, and profitability of their products. The solutions combine proprietary software, physical intellectual property (or IP) for integrated circuit (or IC) designs, electrical measurement hardware tools, various methodologies, and professional services. The company's products and services are sold to integrated device manufacturers (or IDMs), fabless semiconductor companies, foundries, outsourced semiconductor assembly and test (or OSATs), and system houses.

  • Address Santa Clara, CA
  • Market Cap 984.7 million
  • Employees 539
  • Industrial Classification Services-Prepackaged Software
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